Design for Testability Technique for Microcontroller

EXPERMENTAL ANALYSIS OF THE BOUNDARY SCAN AS DESIGN FOR TESTING TECHNIQUE

NEW AUTOMATIC TESTING ARCHITECTURE FOR INTEGRATED CIRCUITS

Design for Testability of Circuits and Systems; An overview

A NEW SINGLE TEST PATTERN GENERATOR FOR PSEUDOEXHAUSTIVE TESTING

DESIGN AND IMPLEMENTATION OF NEW AUTOMATIC TESTING SYSTEM FOR DIGITAL CIRCUITS BASED ON THE SIGNATURE ANALYSIS

COMPUTER AIDED DESIG: COMPUTER AIDED TESTING MODELLING TECHNIQUE

FPGA implementation of the portable automatic testing system for digital circuits

TWO-PATTERN TEST CAPABILITIES OF AUTONOMOUS LFSR/SR GENERATOR IN PSEUDO-EXHAUSTIVE TESTING

Architecture for the BIST Boundary Scan