The boundary scan (BS) technique, formally known as IEEE-1149.1 Standard, offers a convenient alternative to physical probing by effectively migrating the test probe circuitry into the chip which enables a non-contact method of accessing chip pins for testing. In this paper, the incorporation of Built-In Self-Test (BIST) capabilities into the boundary scan architecture is presented. The Boundary Scan Register (BSR) input cells have been con-figured to operate as a Test Pattern Generator (TPG) in the BIST mode. The BSR input and output cells have been configured to operate as an Muti-Input Shift Register (MISR) in the BIST mode. The Tape Controller (TAPC) controls the BIST process. Instructions for BIST process are proposed. This configuration supports BIST for both the cascaded and non-cascaded input and output cells of the BSR.