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30151

EXPERMENTAL ANALYSIS OF THE BOUNDARY SCAN AS DESIGN FOR TESTING TECHNIQUE

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Last updated: 24 Dec 2024

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Abstract

Boundary Scan testing is the IEEE Standard 1149.1 that overcomes many of the drawbacks of the other traditional test techniques. Boundary scan architecture enables us to go step in the direction of the portable testing systems. Designing
testable circuits and interfacing it with the portable computer evaluate the design as a real time application. Therefore, IEEE-1149.1 boundary scan architecture is presented in this paper. A testing architecture of the boundary scan, designed for FPGA, is implemented and evaluated. Channel card of multiplexer is selected as a case study for this evaluation.

DOI

10.21608/iceeng.2018.30151

Keywords

DFT, ICT, Boundary scan, IEEE Standard 1149.1

Authors

First Name

Hossam

Last Name

Ibrahim

MiddleName

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Affiliation

Egyptian Armed Forces.

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Orcid

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First Name

Magdy

Last Name

Ragaee

MiddleName

F.

Affiliation

Dept. of Electronics and Electrical Communications Engineering Faculty of Engineering, Cairo University, Egypt.

Email

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City

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Orcid

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First Name

Hassan

Last Name

Mostafa

MiddleName

-

Affiliation

Dept. of Electronics and Electrical Communications Engineering Faculty of Engineering, Cairo University, Egypt.

Email

-

City

-

Orcid

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Volume

11

Article Issue

11th International Conference on Electrical Engineering ICEENG 2018

Related Issue

5236

Issue Date

2018-04-01

Receive Date

2019-04-15

Publish Date

2018-04-01

Page Start

1

Page End

9

Print ISSN

2636-4433

Online ISSN

2636-4441

Link

https://iceeng.journals.ekb.eg/article_30151.html

Detail API

https://iceeng.journals.ekb.eg/service?article_code=30151

Order

26

Type

Original Article

Type Code

833

Publication Type

Journal

Publication Title

The International Conference on Electrical Engineering

Publication Link

https://iceeng.journals.ekb.eg/

MainTitle

EXPERMENTAL ANALYSIS OF THE BOUNDARY SCAN AS DESIGN FOR TESTING TECHNIQUE

Details

Type

Article

Created At

22 Jan 2023