DESIGN AND IMPLEMENTATION OF NEW AUTOMATIC TESTING SYSTEM FOR DIGITAL CIRCUITS BASED ON THE SIGNATURE ANALYSIS

Design for Testability of Circuits and Systems; An overview

New Digital Testing of Analogue Circuits

FPGA implementation of the portable automatic testing system for digital circuits

A NEW DESIGN FOR COMPRESSION TECHNIQUE FOR TESTABILITY DESIGN

DEVELOPMENT OF AN AUTOMATED SETUP FOR MEASURING DEFECT LEVELS IN SEMICONDUCTORS

AUTOMATIC NORMAL MODE TESTING

Architecture for the BIST Boundary Scan

EXPERMENTAL ANALYSIS OF THE BOUNDARY SCAN AS DESIGN FOR TESTING TECHNIQUE

Digital Testing of Analog Circuits