Design for Testability Technique for Microcontroller

NEW AUTOMATIC TESTING ARCHITECTURE FOR INTEGRATED CIRCUITS

DESIGN AND IMPLEMENTATION OF NEW AUTOMATIC TESTING SYSTEM FOR DIGITAL CIRCUITS BASED ON THE SIGNATURE ANALYSIS

A NEW DESIGN FOR COMPRESSION TECHNIQUE FOR TESTABILITY DESIGN

New Digital Testing of Analogue Circuits

FPGA implementation of the portable automatic testing system for digital circuits

EXPERMENTAL ANALYSIS OF THE BOUNDARY SCAN AS DESIGN FOR TESTING TECHNIQUE

Architecture for the BIST Boundary Scan

Assertion based HDL-models testing for SoC components

Digital Testing of Analog Circuits