EXPERMENTAL ANALYSIS OF THE BOUNDARY SCAN AS DESIGN FOR TESTING TECHNIQUE

FPGA implementation of the BIST intellectual property core for SRAM chips on the board

NEW AUTOMATIC TESTING ARCHITECTURE FOR INTEGRATED CIRCUITS

Design for Testability of Circuits and Systems; An overview

Design for Testability Technique for Microcontroller

A NEW DESIGN FOR COMPRESSION TECHNIQUE FOR TESTABILITY DESIGN

DESIGN AND IMPLEMENTATION OF NEW AUTOMATIC TESTING SYSTEM FOR DIGITAL CIRCUITS BASED ON THE SIGNATURE ANALYSIS

Assertion based HDL-models testing for SoC components

FPGA implementation of the portable automatic testing system for digital circuits

New Digital Testing of Analogue Circuits