DEVELOPMENT OF AN AUTOMATED SETUP FOR MEASURING DEFECT LEVELS IN SEMICONDUCTORS

RELIABILITY EFFECTIVENESS AND LIFE TIMES DETECTION OF COMPLEX SYSTEMS

Dynamic Performance Evaluation of N-channel MOSFET under Gamma Irradiation

DIFFUSION PROCESS IN A TRANSISTOR USING THE BOUNDARY ELEMENT METHOD

Temperature Effects on the Electrical Characteristics of BJTs and MOSFETs

Experimental Validation of the Static and Dynamic Characteristics of a Power MOSFET

An Electrical Model for Atom's Emission and Future Electronics

RELIABILITY IMPROVEMENT OF LOW EARTH ORBIT MICRO SATELLITE

Modeling Reliability in Wireless Sensor Networks

Consensual noise modeling of a microwave transistor