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39820

RELIABILITY OF MICROELECTRONIC DEVICES FROM EMITTERBASE JUNCTION CHARACTERIZATION

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Last updated: 04 Jan 2025

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Abstract

ABSTRACT
The current-voltage characteristics of microelectronic devices are used to compare
commercial components. A double exponential model (VDEM) introduces physical
parameters to characterise the junction properties of bipolar transistor.
The method leads to differentiate the high and low power operating modes of devices
and shows that values of the junction parameters can be associated with each
manufacture and related to quality and reliability control.

DOI

10.21608/amme.2008.39820

Keywords

Quality, Reliability, characterisation, microelectronic

Authors

First Name

TAZBIT

Last Name

W.

MiddleName

-

Affiliation

Laboratoire de physique appliquée et d'automatique LP2A, Université de Perpignan, 52 Avenue Paul Alduy ,66860 Perpignan Cedex, France.

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Orcid

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First Name

MIALHE

Last Name

P.

MiddleName

-

Affiliation

Laboratoire de physique appliquée et d'automatique LP2A, Université de Perpignan, 52 Avenue Paul Alduy ,66860 Perpignan Cedex, France.

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-

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Volume

13

Article Issue

13th International Conference on Applied Mechanics and Mechanical Engineering.

Related Issue

6264

Issue Date

2008-05-01

Receive Date

2019-07-08

Publish Date

2008-05-01

Page Start

29

Page End

37

Print ISSN

2636-4352

Online ISSN

2636-4360

Article File

AMME_Volume 13_Issue 13th International Conference on Applied Mechanics and Mech….pdf

PDF . 296.5kB

Link

https://amme.journals.ekb.eg/article_39820.html

Detail API

https://amme.journals.ekb.eg/service?article_code=39820

Order

141

Type

Original Article

Type Code

831

Publication Type

Journal

Publication Title

The International Conference on Applied Mechanics and Mechanical Engineering

Publication Link

https://amme.journals.ekb.eg/

MainTitle

RELIABILITY OF MICROELECTRONIC DEVICES FROM EMITTERBASE JUNCTION CHARACTERIZATION

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Article

Created At

22 Jan 2023