STUDY OF THE MAJOR CONDITIONS INFLUENCING STEP HEIGHT MEASUREMENT USING INTERFERENCE MICROSCOPE

Highly accurate phase unwrapping algorithm applied to comparative measurement in phase-shifting digital interferometry

Accurate Measurement of Surface Irregularities for a Standard Sphere Using Fizeau Laser Interferometer

Accurate Measurement of Surface Irregularities for a Standard Sphere Using Fizeau Laser Interferometer

ABSOLUTE DISTANCE MEASUREMENT USING FREQUENCY SCANNING INTERFEROMETRY

Comparative Measurement in Speckle Interferometry using Fourier Transform

Comparative Phase-Shifting Digital Speckle Pattern Interferometry Using Single Reference Beam Technique

ON THE MEASUREMENTS. OF SURFACE ROUGHNESS USING LASER SPECKLE

MECHANICAL ALIGNMENT USING LASER DIODES AND SINGLE ELEMENT PHOTO-DETECTORS; RESOLUTION ENHANCEMENT

Off-axis tilt elimination in digital holographic microscopy by self-hologram rotation: applications in surface metrology