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384557

Bivariate general exponential models with stress-strength reliability application

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Last updated: 21 Dec 2024

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Abstract

In this paper, we introduce two families of general bivariate distributions. We refer to
these families as general bivariate exponential family and general bivariate inverse
exponential family. Many bivariate distributions in the literature are members of the
proposed families. Some properties of the proposed families are discussed, as well as a
characterization associated with the stress-strength reliability parameter, R, is presented.
Concerning R, the maximum likelihood estimators and a simple estimator with an explicit
form depending on some marginal distributions are obtained in case of complete
sampling. When the stress is censored at the strength, an explicit estimator of R is also
obtained. The results obtained can be applied to a variety of bivariate distributions in the
literature. A numerical illustration is applied on some well-known distributions. Finally a
real data example is presented to fit one of the proposed models.

DOI

10.1186/s42787-020-0069-y

Keywords

Stress-Strength Reliability, Exponential distribution model, Inverse exponential distribution model, Maximum likelihood estimator

Authors

First Name

S.

Last Name

khames

MiddleName

K.

Affiliation

Department of Mathematics, Faculty of Women, Ain Shams University, Cairo, Egypt

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City

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Orcid

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First Name

N.

Last Name

Mokhlis

MiddleName

A.

Affiliation

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Email

-

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Orcid

-

Volume

28

Article Issue

1

Related Issue

50535

Issue Date

2020-06-01

Receive Date

2024-10-07

Publish Date

2020-06-01

Page Start

1

Page End

15

Print ISSN

1110-256X

Online ISSN

2090-9128

Link

https://joems.journals.ekb.eg/article_384557.html

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https://joems.journals.ekb.eg/service?article_code=384557

Order

384,557

Publication Type

Journal

Publication Title

Journal of the Egyptian Mathematical Society

Publication Link

https://joems.journals.ekb.eg/

MainTitle

Bivariate general exponential models with stress-strength reliability application

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Article

Created At

21 Dec 2024