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An 8-Bit Full-Adder Implementation Using Single Electron Tunneling (SET) Technology.

Article

Last updated: 22 Jan 2023

Subjects

-

Tags

Electronics and Communications Engineering

Abstract

Single Electron Tunneling (SET) devices have come to be considered as promising candidates for future ultra-low power and high-density integrated circuits. Their potential for ultra-low power is related to that the operation is based on only a few electrons. The term Single Electron Tunneling (SET) technology has been selected for devices sensitive to the manipulation of a single electron even if the device itself requires in fact few electrons. Besides, SET provides a simple and elegant solution for implementing threshold Logic Gates (TLGs). 
This paper presents a SET TLG one-bit full-adder implemented in SET technology. The paper then 
introduces the design and implementation of an 8-bit SET TLG full-adder and presents its SIMON 2 
simulation results. 

DOI

10.21608/bfemu.2020.128510

Keywords

Single Electron Tunneling (SET), Threshold Logic Gate (TLG), Full Adder (FA)

Authors

First Name

Sameh

Last Name

Rehan

MiddleName

-

Affiliation

(Senior Member IEEE) Communications and Electronics Engineering Department Faculty of Engineering, Mansoura University Mansoura, EGYPT 35516

Email

-

City

Mansoura

Orcid

-

First Name

Eman

Last Name

Almetwaly

MiddleName

-

Affiliation

Communications and Electronics Engineering Department Faculty of Engineering, Mansoura University Mansoura, EGYPT 35516

Email

-

City

Mansoura

Orcid

-

Volume

32

Article Issue

2

Related Issue

19076

Issue Date

2007-06-01

Receive Date

2007-04-11

Publish Date

2020-12-08

Page Start

79

Page End

85

Print ISSN

1110-0923

Online ISSN

2735-4202

Link

https://bfemu.journals.ekb.eg/article_128510.html

Detail API

https://bfemu.journals.ekb.eg/service?article_code=128510

Order

13

Type

Research Studies

Type Code

1,205

Publication Type

Journal

Publication Title

MEJ. Mansoura Engineering Journal

Publication Link

https://bfemu.journals.ekb.eg/

MainTitle

-

Details

Type

Article

Created At

22 Jan 2023