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315000

Cumulative Sum Control Chart for a Doubly Truncated Binomial Distribution

Article

Last updated: 05 Jan 2025

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Abstract

The CUSUM control chart for a doubly truncated binomial distribution (DTBD) is developed by using the well known approach of Johnson and the parameters of the V-mask are computed. The average run length for the one sided CUSUM scheme for testing the proportion of defectives underlying the DTBD is also obtained and the effect of truncation on this characteristic isĀ investigated

DOI

10.21608/esju.1991.315000

Keywords

Average Run Length, Cumulative Sum Control Chart, Doubly Truncated Binomial Distribution, Truncation Effect, V-mask Parameters

Authors

First Name

Ashit

Last Name

Chakraborty

MiddleName

Baran

Affiliation

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Email

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City

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Orcid

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First Name

Samir

Last Name

Bhattacharya

MiddleName

K.

Affiliation

-

Email

-

City

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Orcid

-

Volume

35

Article Issue

1

Related Issue

43184

Issue Date

1991-06-01

Receive Date

2023-08-28

Publish Date

1991-06-01

Page Start

119

Page End

124

Print ISSN

0542-1748

Online ISSN

2786-0086

Link

https://esju.journals.ekb.eg/article_315000.html

Detail API

https://esju.journals.ekb.eg/service?article_code=315000

Order

9

Type

Original Article

Type Code

1,914

Publication Type

Journal

Publication Title

The Egyptian Statistical Journal

Publication Link

https://esju.journals.ekb.eg/

MainTitle

Cumulative Sum Control Chart for a Doubly Truncated Binomial Distribution

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Article

Created At

28 Dec 2024