Random Number Generation and Goodness -of- Fit Tests for the Lerch Distribution
Last updated: 05 Jan 2025
10.21608/esju.2004.313767
Alias Method, EDF - Kolmogorov Smirnov and Chi-Square Goodness of-Fit Tests - Lerch Transcendent, Polylogarithm, Poisson, Binomial, geometric, Logarithmic - Power Series - Polylogarithmic and Lerch Distributions - Pseudo Random Numbers Generator - Zipf Law
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2004-12-01
2004-12-01
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0542-1748
2786-0086
https://esju.journals.ekb.eg/article_313767.html
https://esju.journals.ekb.eg/service?article_code=313767
1
Original Article
1,914
Journal
The Egyptian Statistical Journal
https://esju.journals.ekb.eg/
Random Number Generation and Goodness -of- Fit Tests for the Lerch Distribution
Details
Type
Article
Created At
28 Dec 2024