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383715

Testing exponentiality against renewal new better than used in Laplace transform order: applications in reliability

Article

Last updated: 29 Dec 2024

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Abstract

In this paper, a new class of life distribution is proposed, named renewal new better
than used in Laplace transform order (RNBUL). The test statistic for testing
exponentiality versus (RNBUL) based on U-statistic is proposed. Pitman's asymptotic
efficiencies of the test and Pitman's asymptotic relative efficiencies (PARE) are
calculated. The percentiles of this test statistic are tabulated, and the powers of this
test are estimated for some famous alternatives distributions in reliability such as
Weibull, linear failure rate (LFR), and Gamma distributions. The problem regarding the
right-censored data is also handled. Finally, some applications to elucidate the
usefulness of the proposed test in reliability analysis are discussed.

DOI

10.1186/s42787-019-0044-7

Keywords

Classes of life distributions, RNBUL, Testing Exponentiality, U test, Pitman asymptotic efficiency, censored data

Authors

First Name

M.

Last Name

Mahmoud

MiddleName

A. W.

Affiliation

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Email

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City

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Orcid

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First Name

L.

Last Name

Diab

MiddleName

S.

Affiliation

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Email

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City

-

Orcid

-

First Name

D.

Last Name

Radi

MiddleName

M.

Affiliation

Department of Basic Science (Mathematics), El Minya High Institute for Engineering and Technology, El-Minia 61111, Egypt

Email

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City

-

Orcid

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Volume

27

Article Issue

1

Related Issue

50652

Issue Date

2019-12-01

Receive Date

2024-10-03

Publish Date

2019-12-01

Page Start

1

Page End

11

Print ISSN

1110-256X

Online ISSN

2090-9128

Link

https://joems.journals.ekb.eg/article_383715.html

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https://joems.journals.ekb.eg/service?article_code=383715

Order

383,715

Publication Type

Journal

Publication Title

Journal of the Egyptian Mathematical Society

Publication Link

https://joems.journals.ekb.eg/

MainTitle

Testing exponentiality against renewal new better than used in Laplace transform order: applications in reliability

Details

Type

Article

Created At

21 Dec 2024