Nonlinear optical properties of semiconductor materials by the Z-scan technique: review article
Last updated: 21 Dec 2024
10.21608/lira.2024.357510
Nonlinear Optics, semiconductor, opto-electronic, Z-scan
Shaimaa
Mohamed
Laser Institute for Research and Applications (LIRA), Beni-Suef University, Beni-Suef 62511, Egypt
Tarek
Mohamed
Laser Institute for Research and Applications (LIRA), Beni-Suef University, Beni-Suef 62511, Egypt
tarek_mohamed1969@lira.bsu.edu.eg
1
2
48270
2024-06-01
2024-06-01
2024-06-01
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84
3009-6359
3009-6472
https://lira.journals.ekb.eg/article_357510.html
https://lira.journals.ekb.eg/service?article_code=357510
357,510
Review article
3,101
Journal
Laser Innovations for Research and Applications
https://lira.journals.ekb.eg/
Nonlinear optical properties of semiconductor materials by the Z-scan technique: review article
Details
Type
Article
Created At
21 Dec 2024