An Intelligent Optimized Digital Twins Framework for Fault Diagnosis in Complex Control Systems
Last updated: 20 Dec 2024
10.21608/jiet.2024.274041.1005
Keywords: Digital Twins(DT), Genetic Algorithm(GA), machine learning(ML), fault diagnosis, Industrial Control Systems
Samar
zayed
M
25 Agricultural street, Cairo, Egypt
eng_samar_zayed@yahoo.com
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1
51553
2024-11-01
2024-03-02
2024-11-01
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68
3009-7207
3009-7568
https://jiet.journals.ekb.eg/article_391786.html
https://jiet.journals.ekb.eg/service?article_code=391786
5
Review Article
2,875
Journal
Journal of Integrated Engineering and Technology
https://jiet.journals.ekb.eg/
An Intelligent Optimized Digital Twins Framework for Fault Diagnosis in Complex Control Systems
Details
Type
Article
Created At
20 Dec 2024