ArticleComparative Phase-Shifting Digital Speckle Pattern Interferometry Using Single Reference Beam Technique
ArticleComparative Phase-Shifting Digital Speckle Pattern Interferometry Using Single Reference Beam Technique
ArticleEffects of the “Source/ surface” and “Surface/sensor” Coupling and Colorimetric of Laser Speckle Pattern on the Performance of Optical Imaging System
ArticleEffects of the “Source/ surface” and “Surface/sensor” Coupling and Colorimetric of Laser Speckle Pattern on the Performance of Optical Imaging System
ArticleThe Effect of Phased Array Parameters on the Detecting Accuracy of Welding Discontinuities and 3D Measurement
ArticleThe Effect of Phased Array Parameters on the Detecting Accuracy of Welding Discontinuities and 3D Measurement
ArticleOff-axis tilt elimination in digital holographic microscopy by self-hologram rotation: applications in surface metrology
ArticleOff-axis tilt elimination in digital holographic microscopy by self-hologram rotation: applications in surface metrology
ArticleHighly accurate phase unwrapping algorithm applied to comparative measurement in phase-shifting digital interferometry
ArticleHighly accurate phase unwrapping algorithm applied to comparative measurement in phase-shifting digital interferometry