SPECTROSCOPIC STUDY ON THE LINE INTENSITY OF SOME TRACE ELEMENTS IN SILICON DIOXIDE MATRIX - Egyptian Knowledge Bank

153674

SPECTROSCOPIC STUDY ON THE LINE INTENSITY OF SOME TRACE ELEMENTS IN SILICON DIOXIDE MATRIX

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Last updated: 23 Jan 2023

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DOI

10.21608/ejs.1993.153674

Volume

Article Issue

Related Issue

22409

Issue Date

1993-02-01

Receive Date

1992-07-04

Publish Date

1993-02-01

Page Start

179

Page End

189

Print ISSN

1012-5566

Online ISSN

2735-5640

Article File

EJS_Volume 16_Issue 1_Pages 179-189.pdf

PDF . 609.9kB

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https://ejs.journals.ekb.eg/article_153674.html

Detail API

https://ejs.journals.ekb.eg/service?article_code=153674

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Journal

Publication Title

Egyptian Journal of Solids

Publication Link

https://ejs.journals.ekb.eg/

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