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150483

Microwave Measurements of the Dielectric Properties of Silicon Carbide at High Temperature

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Last updated: 23 Jan 2023

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Abstract

The dielectric properties of silicon carbide SiC have been measured
using cavity perturbation technique. Three tubes with diameter 2 mm, 3 mm,
and 5 mm were filled with the powerful material of SiC. The measurements
were taken for each tube at different frequencies 0.615 GHz, 1.412 GHz, 2.214
GHz, 3.017 GHz and 3.820 GHz in a temperature range from 25oC to 1800oC.
The electrical conductivity and the activation energy of SiC at the above
frequencies and temperatures were calculated using the measured real and
imaginary components of the complex permittivity.

DOI

10.21608/ejs.2002.150483

Volume

25

Article Issue

2

Related Issue

22140

Issue Date

2002-12-01

Receive Date

2002-04-22

Publish Date

2002-12-01

Page Start

263

Page End

273

Print ISSN

1012-5566

Online ISSN

2735-5640

Link

https://ejs.journals.ekb.eg/article_150483.html

Detail API

https://ejs.journals.ekb.eg/service?article_code=150483

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10

Publication Type

Journal

Publication Title

Egyptian Journal of Solids

Publication Link

https://ejs.journals.ekb.eg/

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Article

Created At

23 Jan 2023