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ArticleHighly accurate phase unwrapping algorithm applied to comparative measurement in phase-shifting digital interferometry
ArticleEffect of System Parameters on Phase Error of Focus-Free Digital Fringe Projection Profilometry System
ArticleEffect of System Parameters on Phase Error of Focus-Free Digital Fringe Projection Profilometry System
ArticleOff-axis tilt elimination in digital holographic microscopy by self-hologram rotation: applications in surface metrology
ArticleOff-axis tilt elimination in digital holographic microscopy by self-hologram rotation: applications in surface metrology