A polycrystalline Bi2(Te1-xSex)3 with variable composition x
(where 0 ≤ x ≤ 1) has been prepared using Bridgman method. Thin films of the
prepared alloys with different compositions were deposited onto ultra clean
glass substrates by the thermal evaporation technique. The as-deposited
Bi2(Te1-xSex)3thin films were investigated by electron scanning microscope
(ESM), energy dispersive spectroscopy (EDAX) and X-ray diffraction (XRD) for
surface morphological, compositional and structural studies. X-ray diffraction
study confirmed that the bulk materials with different compositions are
polycrystalline in nature having rhombohedral structure. The as-deposited films
have amorphous structure but the films annealed at temperatures more than
400 K are polycrystalline. The effect of selenium content and the thermal
annealing on various structural parameters was also investigated. The thin
films exhibit preferential orientation along the [015] direction for the films
annealed at temperatures more than 400 K, together with other abundant
planes (101) and (110). Various structural parameters such as lattice constants,
crystallite size, strain and density have been calculated and they are found to be
compositional dependent.