This investigation was performed under artificial inoculation in the disease nursery at Gemmeiza Agric. Res. Station during 2013 and 2014 growing seasons. Three white and two yellow single cross maize genotypes (Zea mays L.) as well as seven inbred lines shared in its production were evaluated against late wilt caused by Cephalosporium maydis. Data revealed that the best result of late wilt was recorded 40 days, after 50% silking for real evaluating of maize genotypes against the disease. It could be divide the tested maize genotypes into, resistant (Gem.2 and Sd.63), moderately resistant (Sd.7, Gem.18, Sc.10, Sc.21 and Sc.24), moderately susceptible (Gz.639 and Sc.167), susceptible (Gz.658) and highly susceptible (Sc.168). The best crosses were Gem.2xSd.7 and Sd.7xSd.63, which sharing in producing Sc.10 and Sc.21, respectively, (partially resistant). It means that resistance to late wilt depends on incorporation resistant inbred lines in breeding programmes. Yield loss run in a parallel line with susceptibility to infection. The highest loss percentages in yield components i.e., grain weight/ear, 100 grain weight and grain yield/fed. were recorded in case of the highly susceptible S.c.168 followed by inbred line Gz.658. Obtained results revealed that C. maydis is transmitted by maize grains, as internally and externally seedborne in maize genotypes.