From plant breeding point of view, it is important to identify several characters, where plant breeder can use to perform early selection for yield. One of these characters is the area of flag leaf. The objective of this research was to study the contribution of flag leaf dimensions in plant yield of six wheat genotypes that were planted at Tag El-Ezz Research Station, Dakhlia Governorate during the two growing seasons of 1998/99 and 1999/00. Flag leaf length, and width were measured in three dates and used to calculate the area. Simple correlation coefficients and path coefficient analyses were used in addition to stepwise multiple linear regression. The results showed that the area of the flag leaf had higher correlation with the yield of the main spike, and grain number per main spike for 5 of the 6 genotypes. Either flag leaf area or any of its two components has the most prominent direct and indirect effects on the yield of the main spike for all genotypes. The area was the most important predictor for grain number per main spike for four genotypes. Whereas, the length was an important predictor in 2 genotypes. Over all the genotypes, flag leaf width seemed to be the most important predictor for yield of main spike.