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34641

Statistical learning machines from ATR to DNA micro arrays: design, assessment, and advice for practitioners

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Last updated: 24 Dec 2024

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Abstract

Abstract:
Statistical Learning is the process of estimating an unknown probabilistic inputoutput
relationship of a system using a limited number of observations; and a statistical
learning machine (SLM) is the machine that learned such a process. While their roots
grow deeply in Probability Theory, SLMs are ubiquitous in the modern world.
Automatic Target Recognition (ATR) in military applications, Computer Aided
Diagnosis (CAD) in medical imaging, DNA microarrays in Genomics, Optical
Character Recognition (OCR), Speech Recognition (SR), spam email filtering, stock
market prediction, etc., are few examples and applications for SLM; diverse fields but
one theory.
The field of Statistical Learning can be decomposed to two basic subfields, Design
and Assessment. We mean by Design, choosing the appropriate method that learns from
the data to construct an SLM that achieves a good performance. We mean by
Assessment, attributing some performance measures to the designed SLM to assess this
SLM objectively. To achieve these two objectives the field encompasses different other
fields: Probability, Statistics and Matrix Theory; Optimization, Algorithms, and
programming, among others.
Three main groups of specializations—namely statisticians, engineers, and computer
scientists (ordered ascendingly by programming capabilities and descendingly by
mathematical rigor)—exist on the venue of this field and each takes its elephant bite.
Exaggerated rigorous analysis of statisticians sometimes deprives them from
considering new ML techniques and methods that, yet, have no “complete"
mathematical theory. On the other hand, immoderate add-hoc simulations of computer
scientists sometimes derive them towards unjustified and immature results. A prudent approach is needed that has the enough flexibility to utilize simulations and trials and
errors without sacrificing any rigor. If this prudent attitude is necessary for this field it is
necessary, as well, in other fields of Engineering.
In the spirit of this prelude, this article is intended to be a pilot-view of the field that
sheds the light on SLM applications, the Design and Assessment stages, necessary
mathematical and analytical tools, and some state-of-the-art references and research.

DOI

10.21608/iceeng.2008.34641

Keywords

Statistical Learning, Machine Learning, Pattern Recognition, Pattern Classification, Automatic Target Recognition, Computer Aided Diagnosis, Classifier Assessment, Receiver Operating Characteristics

Authors

First Name

Waleed

Last Name

Yousef

MiddleName

A.

Affiliation

Faculty of Computers and Information, Helwan University.

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Volume

6

Article Issue

6th International Conference on Electrical Engineering ICEENG 2008

Related Issue

5700

Issue Date

2008-05-01

Receive Date

2019-06-13

Publish Date

2008-05-01

Page Start

1

Page End

29

Print ISSN

2636-4433

Online ISSN

2636-4441

Link

https://iceeng.journals.ekb.eg/article_34641.html

Detail API

https://iceeng.journals.ekb.eg/service?article_code=34641

Order

187

Type

Original Article

Type Code

833

Publication Type

Journal

Publication Title

The International Conference on Electrical Engineering

Publication Link

https://iceeng.journals.ekb.eg/

MainTitle

Statistical learning machines from ATR to DNA micro arrays: design, assessment, and advice for practitioners

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Article

Created At

22 Jan 2023