Beta
34375

Trends in CMOS image sensor design and technology

Article

Last updated: 24 Dec 2024

Subjects

-

Tags

-

Abstract

Abstract:
After reviewing shortly why CMOS imaging sensors have taken an large part of the
imaging market initially held by CCD devices either for consumer or for industrial and
even scientific applications, this talk will present how CMOS imagers architectures
have evolved to allow for pixel size reduction, to reduce the noise and to increase the
readout rate while taking benefit from the possibility of integrating processing
functions. Additionally, the move to deep submicron technologies (DSM), required for
pixel size reduction or complexity increase, has introduced new challenges to keep and
even improve the sensitivity. State of art solutions allowing the DSM CMOS technology
to face with the imaging requirements will be described.

DOI

10.21608/iceeng.2008.34375

Authors

First Name

Pierre

Last Name

Magnan

MiddleName

-

Affiliation

Prof., Institut Supérieur de l'Aéronautique et de l'Espace, resulting from the association between SUPAERO and ENSICA institutions.

Email

-

City

-

Orcid

-

Volume

6

Article Issue

6th International Conference on Electrical Engineering ICEENG 2008

Related Issue

5700

Issue Date

2008-05-01

Receive Date

2019-06-11

Publish Date

2008-05-01

Page Start

1

Page End

1

Print ISSN

2636-4433

Online ISSN

2636-4441

Link

https://iceeng.journals.ekb.eg/article_34375.html

Detail API

https://iceeng.journals.ekb.eg/service?article_code=34375

Order

108

Type

Original Article

Type Code

833

Publication Type

Journal

Publication Title

The International Conference on Electrical Engineering

Publication Link

https://iceeng.journals.ekb.eg/

MainTitle

Trends in CMOS image sensor design and technology

Details

Type

Article

Created At

22 Jan 2023