MEASURING DEPTH OF ANESTHESIA USING BISPECTRAL ANALYSIS OF THE ELECTROENCEPHALOGRAM (EEG)
Last updated: 24 Dec 2024
10.21608/iceeng.2006.33501
Electroencephalogram, depth of anesthesia, Bispectral Analysis, Sedation, BIS index
Essam
M.
A.,
Graduate student, Biomedical Department, MTC, Cairo, Egypt.
A.
S.
Elkfafi,
PHD, Electronic Department, MTC, Cairo, Egypt.
Alian,
M.
Professor, Electronic Department, Modern Academy, Cairo, Egypt.
E.
Gadallha
Professor, Biomedical Department, MTC, Cairo, Egypt.
5
5th International Conference on Electrical Engineering ICEENG 2006
5615
2006-05-01
2019-05-28
2006-05-01
1
6
2636-4433
2636-4441
https://iceeng.journals.ekb.eg/article_33501.html
https://iceeng.journals.ekb.eg/service?article_code=33501
5
Original Article
833
Journal
The International Conference on Electrical Engineering
https://iceeng.journals.ekb.eg/
MEASURING DEPTH OF ANESTHESIA USING BISPECTRAL ANALYSIS OF THE ELECTROENCEPHALOGRAM (EEG)
Details
Type
Article
Created At
22 Jan 2023