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33284

Consensual noise modeling of a microwave transistor

Article

Last updated: 04 Jan 2025

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Abstract

Abstract:
In this work, a consensual approach is developed and applied to the noise modeling of
microwave transistors. In the proposed method, multiple individual models generated by
an expert system ensemble are combined by a consensus rule that results in a consistent
and improved generalization outputting with the highest possible reliability and
accuracy. Here the expert system ensemble is basically constructed by the competitor
and diverse regressors which in our case are Back-Propagation (BP) Artificial Neural
Network (ANN), Support Vector Regression Machine (SVRM), k-Nearest Neighbor (k-
NN) and Least Squares (LS) algorithms that perform generalization independently from
each other.

DOI

10.21608/iceeng.2010.33284

Keywords

Consensual modeling, Artificial Neural Networks, support vector regression, least squares and k-nearest neighbor algorithm

Authors

First Name

N.

Last Name

Tokan

MiddleName

Türker

Affiliation

Yıldız Technical University, Istanbul, Turkey.

Email

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Orcid

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First Name

F.

Last Name

Güneş

MiddleName

-

Affiliation

Yıldız Technical University, Istanbul, Turkey

Email

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City

-

Orcid

-

First Name

F.

Last Name

Gürgen

MiddleName

-

Affiliation

Boğaziçi University, Istanbul, Turkey.

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-

City

-

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Volume

7

Article Issue

7th International Conference on Electrical Engineering ICEENG 2010

Related Issue

5537

Issue Date

2010-05-01

Receive Date

2019-05-26

Publish Date

2010-05-01

Page Start

1

Page End

8

Print ISSN

2636-4433

Online ISSN

2636-4441

Link

https://iceeng.journals.ekb.eg/article_33284.html

Detail API

https://iceeng.journals.ekb.eg/service?article_code=33284

Order

113

Type

Original Article

Type Code

833

Publication Type

Journal

Publication Title

The International Conference on Electrical Engineering

Publication Link

https://iceeng.journals.ekb.eg/

MainTitle

Consensual noise modeling of a microwave transistor

Details

Type

Article

Created At

22 Jan 2023