Abstract
A melt quenching method have been used for preparing a glass composition of the form (70-x)%B2O3-15%ZnO-15%Na2O-x%Bi2O3 (where x = 0, 5, 10, 15, 20, 25 mol %). The prepared glass was studied by FTIR and Positron annihilation lifetime measurements. FTIR analysis after 80 kGy -irradiation of bismuth-doped glass samples, show the dependence of the number of structural units BO3 and BO4 on the -irradiation dose. FTIR absorption spectra revealed that gamma irradiation produces a degree of a disorder or defects of the glass network which producing colour centres. The objective FTIR spectra were used to estimate the N4 ratio and its dependence on the composition. Positron annihilation lifetime measurements were carried out for all samples before and after 80 kGy -irradiation. Irradiated samples show a colour change, which is most likely due to the formation of colour centres. Such colour changes due to -irradiation allow estimating that the prepared glass samples can be used as a shielding material or as a radiation indicator sensor.